英语翻译XRD spectra were recorded on a Rigaku Ultima-IV X-ray diffractometerwith Ni-filtered Cu K\3radiation (\3 = 0.15418 nm) operatedat 40 kV and 40mA in air,with an environmental humidity ofaround 60%.Samples were tested under diffraction angl

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英语翻译XRD spectra were recorded on a Rigaku Ultima-IV X-ray diffractometerwith Ni-filtered Cu K\3radiation (\3 = 0.15418 nm) operatedat 40 kV and 40mA in air,with an environmental humidity ofaround 60%.Samples were tested under diffraction angl

英语翻译XRD spectra were recorded on a Rigaku Ultima-IV X-ray diffractometerwith Ni-filtered Cu K\3radiation (\3 = 0.15418 nm) operatedat 40 kV and 40mA in air,with an environmental humidity ofaround 60%.Samples were tested under diffraction angl
英语翻译
XRD spectra were recorded on a Rigaku Ultima-IV X-ray diffractometer
with Ni-filtered Cu K\3radiation (\3 = 0.15418 nm) operated
at 40 kV and 40mA in air,with an environmental humidity of
around 60%.Samples were tested under diffraction angle,2\4,in
the range of 5–30◦ with a step interval of 0.5◦ min−1.The profiles
were smoothed and the background was subtracted from all of the
data.Transmission electron microscopy (TEM) analyses were performed
for the membranes stained with silver ions.SPI samples
were immersed in 0.5M AgNO3 aqueous solution overnight,then
rinsed with water and dried at room temperature for 24 h.Images
were taken on a Tecnai G2 F20 transmission electron microscope
using an accelerating voltage of 200 kV.

英语翻译XRD spectra were recorded on a Rigaku Ultima-IV X-ray diffractometerwith Ni-filtered Cu K\3radiation (\3 = 0.15418 nm) operatedat 40 kV and 40mA in air,with an environmental humidity ofaround 60%.Samples were tested under diffraction angl
XRD spectra were recorded on a Rigaku Ultima-IV X-ray diffractometer with Ni-filtered Cu K\x03radiation (\x03 = 0.15418 nm) operated at 40 kV and 40mA in air, with an environmental humidity of around 60%. Samples were tested under diffraction angle, 2\x04, in the range of 5–30◦ with a step interval of 0.5◦ min−1. The profiles were smoothed and the background was subtracted from all of the data. Transmission electron microscopy(TEM) analyses were performed for the membranes stained with silver ions. SPI samples were immersed in 0.5M AgNO3 aqueous solution overnight, then
rinsed with water and dried at room temperature for 24h. Images
were taken on a Tecnai G2 F20 transmission electron microscope
using an accelerating voltage of 200 kV.
常规空气中,保持工作电压40kV、电流40mA,室内湿度(或周围湿度)60%左右,经镍滤过处理铜K\x03量级(\x03量级=0.15418nm)辐射,采用日本理学(株式会社)创世纪IV型X光衍射计记录X射线衍射(XRD)光谱.保持衍射角(量级2\x04)5-30°间、阶距0.5°/min,对样本(或:样品)进行测试.对剖面进行除障平滑处理,所有数据予背景剪影.待银离子着色后,用透射电子显微镜(TEM)对染色膜片分析处理.将磺化聚酰亚胺(SPI)样品浸入0.5mol/L的硝酸银(AgNO3)水溶液中、浸泡一夜,次日水冲洗,常温晾晒24小时置干.然后施加200kV加速电压、经Tecnai G2 F20透射电子显微镜拍摄成像.
 
注:

XRD=X-Ray Diffraction, X射线衍射

SPI=Sulfonated polyimides,磺化聚酰亚胺

0.5M,M=mol/L

Tecnai,FEI公司透电显微镜产品品牌

 
供参

XRD结果被记录在一个Rigaku创世纪4 x射线衍射仪
与镍过滤铜Kradiation(= 0.15418 nm)操作
在40千伏和40马在空气中,与环境湿度
大约60%。水样在衍射角,2,在
30◦的范围与一个步骤区间为0.5◦min−1。这个概要文件
被抚平,背景是减去所有的吗
数据。透射电子显微镜(TEM)...

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XRD结果被记录在一个Rigaku创世纪4 x射线衍射仪
与镍过滤铜Kradiation(= 0.15418 nm)操作
在40千伏和40马在空气中,与环境湿度
大约60%。水样在衍射角,2,在
30◦的范围与一个步骤区间为0.5◦min−1。这个概要文件
被抚平,背景是减去所有的吗
数据。透射电子显微镜(TEM)进行了分析
为沾染了银离子膜。SPI样本
沉浸于0.5 m硝酸银水溶液一夜之间,然后呢
用水冲洗和干在室温下24 h。图像
被带到Tecnai G2 F20透射电子显微镜吗
使用一个加速电压200伏特。
我文科生,有的专属词没见过,累啊

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第一句比较长:
XRD spectra were recorded
 on a Rigaku Ultima-IV X-ray diffractometer
 with Ni-filtered Cu K\3radiation (\3 = 0.15418 nm)
 operated at 40 kV and 40mA in air,
 with an e...

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第一句比较长:
XRD spectra were recorded
 on a Rigaku Ultima-IV X-ray diffractometer
 with Ni-filtered Cu K\3radiation (\3 = 0.15418 nm)
 operated at 40 kV and 40mA in air,
 with an environmental humidity of around 60%.
在带有镍过滤的Cu K\3放射(\3 = 0.15418 nm) 的Rigaku Ultima-IV X射线衍射仪上记录XRD光谱,在空气中,操作电压40 kV、电流40mA,环境湿度60%左右。样本基于衍射角 2\4,范围5–30◦,阶距0.5◦ min−1进行测试。将轮廓弄平滑,并从所有数据中去除背景。为沾满银离子的薄膜进行透射式电子显微镜法(TEM)分析。将SPI样本浸入0.5M AgNO3水溶液一个通宵,再用水冲洗后在室温下晾干24小时。在Tecnai G2 F20透射式电子显微镜用200 kV加速电压取得图像。

不敢保证完全准确。

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X线衍射光谱,记录在理学公司Ultima-IV X光衍射仪上,采用镍滤过铜K辐射(\3 = 0.15418 nm)操作于空气中40 kV 和 40mA,环境温度约60%。 样本测试于衍射角度2\4,范围5–30◦ ,步进0.5◦ min−1。侧视图平滑化且背景从所有数据中消除(即数字减影)。用透射电子显微镜法(TEM) 分析沾染过银离子的薄膜。SPI 样本沉浸在...

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X线衍射光谱,记录在理学公司Ultima-IV X光衍射仪上,采用镍滤过铜K辐射(\3 = 0.15418 nm)操作于空气中40 kV 和 40mA,环境温度约60%。 样本测试于衍射角度2\4,范围5–30◦ ,步进0.5◦ min−1。侧视图平滑化且背景从所有数据中消除(即数字减影)。用透射电子显微镜法(TEM) 分析沾染过银离子的薄膜。SPI 样本沉浸在0.5M AgNO3 水溶液中一夜,然后用水漂洗,并在常温下干燥24小时。图像用200 kV加强电压拍摄在Tecnai G2 F20透射电子显微镜上。

医学影像,专业性太高,术语未必准确,只能做参考。

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......... 不知道