英语翻译Near-field scanning optical microscopy (NSOM/SNOM) is a microscopic technique for nanostructure investigation that breaks the far field resolution limit by exploiting the properties of evanescent waves.This is done by placing the detector

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英语翻译Near-field scanning optical microscopy (NSOM/SNOM) is a microscopic technique for nanostructure investigation that breaks the far field resolution limit by exploiting the properties of evanescent waves.This is done by placing the detector

英语翻译Near-field scanning optical microscopy (NSOM/SNOM) is a microscopic technique for nanostructure investigation that breaks the far field resolution limit by exploiting the properties of evanescent waves.This is done by placing the detector
英语翻译
Near-field scanning optical microscopy (NSOM/SNOM) is a microscopic technique for nanostructure investigation that breaks the far field resolution limit by exploiting the properties of evanescent waves.This is done by placing the detector very close (

英语翻译Near-field scanning optical microscopy (NSOM/SNOM) is a microscopic technique for nanostructure investigation that breaks the far field resolution limit by exploiting the properties of evanescent waves.This is done by placing the detector
近场扫描光学显微镜( NSOM /扫描)是一种微小的纳米技术的调查,打破了远场决议限制利用的属性渐逝波.这是通过把探测器非常接近“ ( < ” λ )的表面.这使检查的表面具有高空间,光谱和时间分辨率.这一技术,该决议的形象而受到限制的大小探测器孔径,而不是由波长的光线照明.特别是,横向分辨率为20 nm和垂直分辨率为2-5纳米已被证明.[ 1 ]在光学显微镜,对比度机制可以很容易地适应不同性质的研究,如折射率,化学结构和局部应力.动态特性研究也可以在子波长大规模使用这种技术.